1 day (24 hrs) UNIVERSITY Membership for $1 USD
The International XPS Spectra-Base of
Monochromatic XPS Reference Spectra ($1 USD)
$1 for 24 hour trial
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Overview
Each page provides XPS spectra from a series of materials: pure element, native oxide, most common pure oxide, and other chemical compounds that may include hydroxide, oxy-hydroxide, carbonate, bi-carbonate, sulfide, sulfate, nitride, nitrate, phosphide, phosphate, selenide, telluride. Most of the oxides are single crystals or natural crystals freshly cleaved to expose bulk. Semiconductor wafers and crystals have been cleaved to expose bulk. There are time-based Profiles, Flood Gun tests, and Auger spectra. To add a bit of color, there are two sets of photos from crystals that include the element being displayed. A total of six (6) different BE tables from various sources are included.
The Spectra-Base currently (Jan 2025) has:
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- >500 survey spectra,
- >2,500 chemical state spectra,
- >2,500 peak-fits of chemical state spectra,
- >600 overlays of chemical state spectra,
- >400 side-by-side comparisons of chemical state spectra.
- >150 time study Montage plots showing UHV gas capture by freshly ion etched metals,
- >150 overlays showing flood gun effects on native oxides
- >200 photos of minerals containing element of interest
- >90 tables of key information listing peak overlaps, spin-orbit terms, BEs, Scofield cross-sections and IMFP of pure element
- >500 tables of BEs (from 6 different sources)
Components on each Page:
Basic Information Section (spectra and BE tables)
- Three (3) links to: (a) Periodic Table, (b) XPS Database of Polymers, and (c) Six (6) BE Tables
- ….Page Index (not yet active).
- Chemical State Spectra (raw and peak-fit with details)
- Survey Spectra (fully labelled, pure element, native oxide, pure oxide, other chemical states)
- Carbon (1s) and O (1s) spectra (or F (1s), S (2p), N (1s), P (2p), Cl (2p), Br (3d), I (4d), Se (3d), Te (4d) etc.)
- Valence Band Spectra
- Spectra of Auger Signals
- Plasmon Spectra
- Table of Overlaps, BEs, Scofield cross-sections, and IMFP
- Links to home page – Periodic Table and Six (6) BE Tables
- Artefacts of ion etching
- Side-by-side spectra for comparisons (native oxide versus element versus pure oxide…)
- Overlays of related spectra (e.g. metal, native oxide, pure oxide, sulfide, BE shifts, peak-shape differences)
- Six (6) Tables of Chemical State BEs from different websites (BEs are from smallest to largest)
- The NIST table is quite long and organized by BE value (smallest to largest)
- Histograms of pure element BEs, pure oxide BEs and others from NIST SRD-20 database of BEs
- Periodic Table showing results of Statistical Analysis of BEs in NIST SRD-20 database of BEs
Advanced Information Section (advanced spectra & research studies)
- Comparison of Element, Pure Oxide, and Fluoride of the Element (showing extreme range of BEs)
- Detailed set of spectra from common pure oxide
- Display of spectra having Shake-up
- Display of spectra having Multiplet Splitting
- Flood gun effect on Native Oxide of Element (flood gun OFF versus ON and Floating: C (1s) O (1s) and Metal Signal)
- XPS Study of UHV Gas Captured by Freshly Ion Etched Element – in main analysis chamber – overnight run – C (1s), O (1s) and metal signal
- AES (Auger) Study of UHV Gas Captured by Freshly Ion Etched Element – in main analysis chamber – overnight run – C (1s), O (1s) and metal signal
- Chemical State Spectra from High Energy Resolution Auger instrument having CHA (HSA) electron analyzer
Tables of XPS Facts, Guidance & Information
- Basic information about element
- Information useful for peak-fitting main element signal
- General guidance for peak-fitting
- Commonplace Contaminants
- Data collection guidance
- Data collection settings for each element
- Effects of argon ion etching
- Gas phase spectra of related species if available